JPS5733416Y2 - - Google Patents
Info
- Publication number
- JPS5733416Y2 JPS5733416Y2 JP6124877U JP6124877U JPS5733416Y2 JP S5733416 Y2 JPS5733416 Y2 JP S5733416Y2 JP 6124877 U JP6124877 U JP 6124877U JP 6124877 U JP6124877 U JP 6124877U JP S5733416 Y2 JPS5733416 Y2 JP S5733416Y2
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
- Measuring Leads Or Probes (AREA)
- Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP6124877U JPS5733416Y2 (en]) | 1977-05-13 | 1977-05-13 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP6124877U JPS5733416Y2 (en]) | 1977-05-13 | 1977-05-13 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS53156569U JPS53156569U (en]) | 1978-12-08 |
| JPS5733416Y2 true JPS5733416Y2 (en]) | 1982-07-23 |
Family
ID=28962419
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP6124877U Expired JPS5733416Y2 (en]) | 1977-05-13 | 1977-05-13 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5733416Y2 (en]) |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS60183879U (ja) * | 1984-05-15 | 1985-12-06 | 三菱電機株式会社 | 半導体試験装置の接触子 |
| JP2590329B2 (ja) * | 1987-01-13 | 1997-03-12 | 東京エレクトロン株式会社 | 検査装置 |
-
1977
- 1977-05-13 JP JP6124877U patent/JPS5733416Y2/ja not_active Expired
Also Published As
| Publication number | Publication date |
|---|---|
| JPS53156569U (en]) | 1978-12-08 |